Abstract
A transmission electron microscopy (TEM) investigation of the morphology of quantum dots grown on a GaAs(001) substrate has been carried out. The size and the shape of the quantum dots have been determined using bright-field images of cross-section TEM specimens and [001] on-zone bright-field images with imaging simulation from plan-view TEM specimens. The results suggest that the coherent quantum dots are lens shaped with base diameters of and aspect ratios of height to diameter of .
- Received 30 June 1998
DOI:https://doi.org/10.1103/PhysRevB.59.12279
©1999 American Physical Society