• Rapid Communication

Silicon interband transitions observed at Si(100)SiO2 interfaces

G. Erley and W. Daum
Phys. Rev. B 58, R1734(R) – Published 15 July 1998
PDFExport Citation

Abstract

We report on a type of Si interband transitions at Si(100)SiO2 interfaces that has no equivalent in the bulk of crystalline silicon. These transitions, leading to strong resonances in optical second-harmonic-generation spectra with energies of 3.6–3.8 eV, are energetically located between the E1 and E2 critical points of bulk Si. We assign these transitions to Si atoms without Td lattice symmetry at the boundary between crystalline Si and the SiOx transition region. We also report on a strong blueshift of the E2 transitions at the interface.

  • Received 23 March 1998

DOI:https://doi.org/10.1103/PhysRevB.58.R1734

©1998 American Physical Society

Authors & Affiliations

G. Erley* and W. Daum

  • Institut für Grenzflächenforschung und Vakuumphysik, Forschungszentrum Jülich, D-52425 Jülich, Germany

  • *Present address: Dept. of Chemistry, University of California, Irvine, CA 92697-2025.

References (Subscription Required)

Click to Expand
Issue

Vol. 58, Iss. 4 — 15 July 1998

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×