Interface roughness localization in quantum wells and quantum wires

Ivan Rasnik, Luis G. C. Rego, Maria V. Marquezini, Adriana L. C. Triques, Maria J. S. P. Brasil, José A. Brum, and Mônica A. Cotta
Phys. Rev. B 58, 9876 – Published 15 October 1998
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Abstract

We studied the effects of interface localization due to microroughness in a sample presenting a quantum well and a quantum wire. We measured the magnetoluminescence at different temperatures and analyzed the results with a model where the average microroughness, the magnetic field, and the excitonic effects are treated within the same level of approximation. We were able to extract a quantitative estimate for the exciton localization due to microroughness. Our results also demonstrate the efficiency of the temperature to detrap excitons from the interface roughness localization.

  • Received 10 March 1998

DOI:https://doi.org/10.1103/PhysRevB.58.9876

©1998 American Physical Society

Authors & Affiliations

Ivan Rasnik, Luis G. C. Rego, Maria V. Marquezini, Adriana L. C. Triques, Maria J. S. P. Brasil, José A. Brum, and Mônica A. Cotta

  • Instituto de Física, DFESCM, UNICAMP, 13083-970 Campinas (SP), Brazil

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Vol. 58, Iss. 15 — 15 October 1998

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