• Rapid Communication

Rapid carrier relaxation in In0.4Ga0.6As/GaAs quantum dots characterized by differential transmission spectroscopy

T. S. Sosnowski, T. B. Norris, H. Jiang, J. Singh, K. Kamath, and P. Bhattacharya
Phys. Rev. B 57, R9423(R) – Published 15 April 1998
PDFExport Citation

Abstract

Carrier relaxation in self-organized In0.4Ga0.6As/GaAs quantum dots is investigated by time-resolved differential transmission measurements. The dots have a base dimension of around 14 nm and a height of 7 nm, leading to an average energy separation of the ground and first excited electronic states much greater than the LO-phonon energy, so the phonon-mediated electron relaxation is expected to be slow. Our measurements indicate that, even at low carrier densities (less than one electron-hole pair per dot), the electron and hole relaxation time constants are 5.2 and 0.6 ps, respectively; this indicates a lack of any “phonon bottleneck” and is consistent with a model of electrons scattering from holes which can relax rapidly via phonon emission.

  • Received 24 February 1998

DOI:https://doi.org/10.1103/PhysRevB.57.R9423

©1998 American Physical Society

Authors & Affiliations

T. S. Sosnowski and T. B. Norris

  • Center for Ultrafast Optical Science and Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, Michigan 48109-2099

H. Jiang, J. Singh, K. Kamath, and P. Bhattacharya

  • Solid State Electronics Laboratory and Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, Michigan 48109-2099

References (Subscription Required)

Click to Expand
Issue

Vol. 57, Iss. 16 — 15 April 1998

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×