Characterization of normal and inverted interfaces by the Zeeman effect in Cd1xMnxTe/CdTe/Cd1yMgyTe quantum wells

A. Lemaître, C. Testelin, C. Rigaux, S. Maćkowski, Nguyen The Khoi, J. A. Gaj, G. Karczewski, T. Wojtowicz, and J. Kossut
Phys. Rev. B 57, 4708 – Published 15 February 1998
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Abstract

We present a study of the interface profile in asymmetric Cd1xMnxTe/CdTe/Cd1yMgyTe quantum wells, with normal (Cd1xMnxTe on CdTe) and inverted (CdTe on Cd1xMnxTe) interfaces. The Zeeman spectra of the confined exciton states were determined by magnetoreflectivity and Kerr rotation measurements. Using a segregation model and an asymmetric exponential profile, we interpret the Zeeman spectra of quantum wells, and determine the interface widths. For the same concentrations of Mn in the barriers and the same growth conditions, the results can be coherently explained assuming an interface width independent of the quantum-well width and the type of interface (normal or inverted).

  • Received 13 May 1997

DOI:https://doi.org/10.1103/PhysRevB.57.4708

©1998 American Physical Society

Authors & Affiliations

A. Lemaître, C. Testelin, and C. Rigaux

  • Groupe de Physique des Solides, Universités Paris 6 et 7, 2 place Jussieu, 75231 Paris Cedex 05, France

S. Maćkowski, Nguyen The Khoi, and J. A. Gaj

  • Institute of Experimental Physics, Warsaw University, 69 Hoża, 00-681 Warszawa, Poland

G. Karczewski, T. Wojtowicz, and J. Kossut

  • Institute of Physics, Polish Academy of Sciences, Aleja, Lotników 32/46, Warszawa, Poland

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Vol. 57, Iss. 8 — 15 February 1998

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