Formation and annihilation of a bond defect in silicon: An ab initio quantum-mechanical characterization

F. Cargnoni, C. Gatti, and L. Colombo
Phys. Rev. B 57, 170 – Published 1 January 1998
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Abstract

The electronic structure and bond properties of a lattice defect in silicon formed by the incomplete recombination of a vacancy-interstitial pair are described by combining tight-binding molecular-dynamics and ab initio Hartree-Fock calculations. The defect structure consists of a large nuclear distortion nearly perfectly compensated by electron charge rearrangment. The reaction path for its annihilation is reported and described in terms of an electron-density topological analysis within the quantum theory of atoms in molecules approach.

  • Received 12 June 1997

DOI:https://doi.org/10.1103/PhysRevB.57.170

©1998 American Physical Society

Authors & Affiliations

F. Cargnoni and C. Gatti

  • Centro CNR per lo Studio delle Relazioni fra Struttura e Reattività Chimica, via Golgi 19, I-20133 Milano, Italy

L. Colombo

  • Istituto Nazionale per la Fisica della Materia and Dipartimento di Scienza dei Materiali, Università degli Studi di Milano, via Emanueli 15, I-20126 Milano, Italy

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Vol. 57, Iss. 1 — 1 January 1998

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