dc conductivity of semiconducting glasses: The role of negative-U centers, and pressure-induced phenomena

M. I. Klinger and S. N. Taraskin
Phys. Rev. B 57, 12898 – Published 15 May 1998
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Abstract

The ohmic dc conductivity, as a representative example of the electronic transport coefficients for semiconducting glasses, is theoretically characterized within the framework of the recent theory of negative-U centers. The latter are self-trapped singlet electron (hole) pairs, strongly bound and localized at ambient pressure. Pressure-induced delocalization of the negative-U centers and their single-particle excitations in semiconducting glasses is predicted at high pressures p>~pc, the critical pressure being pc105 bar. Thereby, the temperature and pressure dependencies of the dc conductivity, as well as its scale, are basically different at ppc (in particular at ambient pressure) or at p>pc. The standard electron-hole pairs determine the thermally activated conductivity at p<pc, whereas the delocalized negative-U centers give rise to the quasimetallic conductivity at high pressures and not too high temperatures.

  • Received 20 February 1997

DOI:https://doi.org/10.1103/PhysRevB.57.12898

©1998 American Physical Society

Authors & Affiliations

M. I. Klinger*

  • Department of Physics, Bar Ilan University, 52900 Ramat Gan, Tel Aviv, Israel

S. N. Taraskin

  • Department of Chemistry, University of Cambridge, Lensfield Road, Cambridge CB2 1EW, United Kingdom

  • *Author to whom correspondence should be addressed. FAX: +972-3-5353298. Electronic address:

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Vol. 57, Iss. 20 — 15 May 1998

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