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Spontaneous-emission-lifetime alteration in InxGa1xAs/GaAs vertical-cavity surface-emitting laser structures

Yoshihiko Hanamaki, Hiromu Kinoshita, Hidefumi Akiyama, Nagaatsu Ogasawara, and Yasuhiro Shiraki
Phys. Rev. B 56, R4379(R) – Published 15 August 1997
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Abstract

The spontaneous-emission lifetime of In0.2Ga0.8As/GaAs vertical-cavity surface-emitting laser structures was investigated at room temperature as a function of reflectivity of AlAs/GaAs distributed Bragg reflectors (DBR’s). As the reflectivity of DBR’s became higher, the spontaneous-emission lifetime measured at the resonance wavelength of the cavity became drastically shorter in the cavity axis direction. This spontaneous-emission-lifetime alteration was much more than that of the previous experimental results for quantum wells and the theoretical estimation for atomic dipoles in the planar microcavity structures.

  • Received 5 May 1997

DOI:https://doi.org/10.1103/PhysRevB.56.R4379

©1997 American Physical Society

Authors & Affiliations

Yoshihiko Hanamaki

  • Research Center for Advanced Science and Technology (RCAST), The University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 154, Japan

Hiromu Kinoshita

  • Department of Electronics Engineering, University of Electro-Communications, 1-5-1 Choufugaoka, Chofu, Tokyo 182, Japan

Hidefumi Akiyama

  • Institute for Solid State Physics (ISSP), The University of Tokyo, 7-22-1 Roppongi, Minato-ku, Tokyo 106, Japan

Nagaatsu Ogasawara

  • Department of Electronics Engineering, University of Electro-Communications, 1-5-1 Choufugaoka, Chofu, Tokyo 182, Japan

Yasuhiro Shiraki

  • Research Center for Advanced Science and Technology (RCAST), The University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 154, Japan

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Vol. 56, Iss. 8 — 15 August 1997

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