Optical near-field response of semiconductor quantum dots

B. Hanewinkel, A. Knorr, P. Thomas, and S.W. Koch
Phys. Rev. B 55, 13715 – Published 15 May 1997
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Abstract

The near-field response of optically excited semiconductor quantum dots is theoretically investigated for the collection and illumination mode of a scanning near-field optical microscope. The study includes resolution, spectral line shape, and field distributions of single and interacting dots. It is shown that in contrast to near-field excitation of molecules with large dipole moments, the line shape and position of typical semiconductor quantum dots can be determined without a disturbance if realistic values for the intrinsic linewidth are assumed. The comparison of regular and irregular quantum-dot distributions yields characteristic signatures for disordered arrays, necessary to understand the optical response of realistic semiconductor quantum dot samples.

    DOI:https://doi.org/10.1103/PhysRevB.55.13715

    ©1997 American Physical Society

    Authors & Affiliations

    B. Hanewinkel, A. Knorr, P. Thomas, and S.W. Koch

    • Department of Physics and Material Sciences Center, Philipps-Universität, Renthof 5, D-35032 Marburg, Germany

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    Vol. 55, Iss. 20 — 15 May 1997

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