Abstract
Low temperature photoluminescence and photoluminescence excitation measurements have been performed in a set of As/GaAs samples with a different indium molar fraction, well width, growth conditions, and post-growth treatment. This has allowed to change in a controlled way the degree and source of disorder in the samples, thus resulting in an excitonic absorption linewidth varying between 1 and 18 meV, and an ensuing Stokes shift changing between zero and 8 meV. The conditions of validity of two different models relating the Stokes shift to the linewidth broadening have been established in terms of different regimes of disorder and temperature. A continuous transition between those regimes has been demonstrated. © 1996 The American Physical Society.
- Received 10 July 1996
DOI:https://doi.org/10.1103/PhysRevB.54.16389
©1996 American Physical Society