Roughness of heterointerfaces and averaging effects by excitons: Interpretation of cathodoluminescence images

E. Runge, J. Menniger, U. Jahn, R. Hey, and H. T. Grahn
Phys. Rev. B 52, 12207 – Published 15 October 1995
PDFExport Citation

Abstract

Cathodoluminescence (CL) in a scanning electron microscope is often used to probe the heterointerface roughness of quantum wells. The CL intensity patterns are then interpreted as a direct mapping of the interface structure. We argue that generally the correlation length of the interface roughness is smaller than the lateral resolution of the CL mode and that it is the latter that determines the patterns of the images. A theoretical formulation based on a statistical interpretation of the CL images is proposed as a promising route to extract the characteristic size of interface roughness structures from the modulation depth, i.e., the contrast, of the images. CL data recorded from two GaAs/AlxGa1xAs quantum wells with completely different interface roughness confirm the validity of our model.

  • Received 28 July 1995

DOI:https://doi.org/10.1103/PhysRevB.52.12207

©1995 American Physical Society

Authors & Affiliations

E. Runge

  • Max-Planck-AG Halbleitertheorie, Hausvogteiplatz 5-7, D-10117 Berlin, Germany

J. Menniger, U. Jahn, R. Hey, and H. T. Grahn

  • Paul-Drude-Institut für Festkörperelektronik, Hausvogteiplatz 5-7, D-10117 Berlin, Germany

References (Subscription Required)

Click to Expand
Issue

Vol. 52, Iss. 16 — 15 October 1995

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×