Reflectance study of the oscillator strength of excitons in semiconductor quantum wells

Baoping Zhang, Satoru S. Kano, Yasuhiro Shiraki, and Ryoichi Ito
Phys. Rev. B 50, 7499 – Published 15 September 1994
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Abstract

The oscillator strength of excitons is investigated systematically in lattice-matched GaAs/AlxGa1xAs, strained-well InxGa1xAs/GaAs, and strained-well GaAs/GaAs1xPx quantum wells (QW’s) using Fourier-transform reflectance spectroscopy. The oscillator strength in GaAs/AlxGa1xAs QW’s increases as the well width is reduced, in agreement with the existing theory, while those in InxGa1xAs/GaAs and GaAs/GaAs1xPx QW’s show a maximum at a certain well width. The well-width dependence of the band nonparabolicity and the overlap of the electron and hole wave functions is responsible for this behavior. The oscillator strengths in InxGa1xAs/GaAs and GaAs/GaAs1xPx QW’s are differently dependent on the alloy composition; this is also explained in terms of the band nonparabolicity and the wave-function overlap. The temperature dependence of the oscillator strength in these structures is well described by a modified Debye-Waller expression with an averaged phonon mode. The exciton-phonon interaction, deduced from the temperature dependence of the oscillator strength of the zero-phonon line, is mainly determined by confined phonons in GaAs/AlxGa1xAs QW’s, and by quasi-three-dimensional phonons in InxGa1xAs/GaAs QW’s.

  • Received 11 April 1994

DOI:https://doi.org/10.1103/PhysRevB.50.7499

©1994 American Physical Society

Authors & Affiliations

Baoping Zhang, Satoru S. Kano, and Yasuhiro Shiraki

  • Research Center for Advanced Science and Technology, The University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153, Japan

Ryoichi Ito

  • Department of Applied Physics, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113, Japan

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Issue

Vol. 50, Iss. 11 — 15 September 1994

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