Abstract
Optical second-harmonic generation from a thin film was used to monitor the orientational phase transition. A jump in second-harmonic intensity was observed around 245 K. This observation is in good agreement with the results obtained from infrared and Raman spectroscopy from films. The different response of films in the two phases is analyzed and tentatively explained.
- Received 21 April 1994
DOI:https://doi.org/10.1103/PhysRevB.50.4940
©1994 American Physical Society