Photoacoustic characterization of the thermal properties of a semiconductor-glass two-layer system

J. J. Alvarado-Gil, O. Zelaya-Angel, H. Vargas, and J. L. Lucio M.
Phys. Rev. B 50, 14627 – Published 15 November 1994
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Abstract

The photoacoustic technique is used to investigate the thermal properties of a two-layer system, of variable thickness, consisting of a semiconductor polycrystalline thin film and glass. It is shown that the thermal diffusivity and thermal conductivity are completely determined based upon the effective sample model proposed by Mansanares et al. [Phys. Rev. B 42, 4477 (1990)].

  • Received 19 July 1994

DOI:https://doi.org/10.1103/PhysRevB.50.14627

©1994 American Physical Society

Authors & Affiliations

J. J. Alvarado-Gil, O. Zelaya-Angel, and H. Vargas

  • Centro de Investigación y Estudios Avanzados del Instituto Politécnico Nacional, Apartado Postal 14-740, México Distrito Federal 07000, Mexico

J. L. Lucio M.

  • Instituto de Física, Universidad de Guanajuato, Apartado Postal E-143, León Guanajuato 3750, Mexico

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Vol. 50, Iss. 19 — 15 November 1994

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