Rate of electron tunneling in double quantum wells with nonideal interfaces

F. T. Vasko and O. E. Raichev
Phys. Rev. B 50, 12195 – Published 15 October 1994
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Abstract

The electron tunneling relaxation rate ν caused by scattering from interface roughness in double quantum wells is calculated as a function of the interlevel splitting Δ and the coupling level numbers. The dependence ν(Δ) near the resonances is asymmetric with respect to Δ=0. This asymmetry appears because the roughnesses cause not only nonuniform changes to the electron quantization energies, but also inhomogeneities of the tunneling matrix element. The results are compared with the experimental data.

  • Received 8 June 1994

DOI:https://doi.org/10.1103/PhysRevB.50.12195

©1994 American Physical Society

Authors & Affiliations

F. T. Vasko and O. E. Raichev

  • Institute of Semiconductor Physics, Prospekt Nauki 45, Kiev-28, 252650, Ukraine

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Issue

Vol. 50, Iss. 16 — 15 October 1994

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