Conductivity Studies in Europium Oxide

M. R. Oliver, J. O. Dimmock, A. L. McWhorter, and T. B. Reed
Phys. Rev. B 5, 1078 – Published 1 February 1972
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Abstract

The electrical and optical properties of EuO are studied in order to help determine conduction mechanisms. A strong relationship between growth parameters and electrical behavior is noted. Free-carrier absorption below the band edge in energy is observed in moderately conducting crystals. By comparing optical and electrical results, an experimental determination is made of carrier-density and scattering-time contributions to resistivity behavior. The carrier-density variations are explained in terms of an earlier proposed model which is developed here. The model consists of a donor-trap level, believed to be caused by an oxygen vacancy, which is above the conduction-band edge at low temperature, but crosses below it (near 50 °K) with increasing temperature. Magnetoresistance and pressure results are presented which strongly support the model.

  • Received 3 March 1971

DOI:https://doi.org/10.1103/PhysRevB.5.1078

©1972 American Physical Society

Authors & Affiliations

M. R. Oliver*,†, J. O. Dimmock, A. L. McWhorter*, and T. B. Reed

  • Lincoln Laboratory, Massachusetts Institute of Technology, Lexington, Massachusetts 02173

  • *Also Department of Electrical Engineering, Massachusetts Institute of Technology, Cambridge, Mass.
  • Work based on a thesis submitted to the Massachusetts Institute of Technology in partial fulfillment of the requirements of Doctor of Science.

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Vol. 5, Iss. 3 — 1 February 1972

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