Magnetic-field-induced free electron and hole recombination in semimetallic AlxGa1xSb/InAs quantum wells

Ikai Lo, W. C. Mitchel, and J.-P. Cheng
Phys. Rev. B 48, 9118 – Published 15 September 1993; Erratum Phys. Rev. B 49, 7833 (1994)
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Abstract

We observed the carrier-concentration dependence of the magnetic-field-induced free electron and hole recombination in semimetallic AlxGa1xSb/InAs quantum wells. The electrons and holes recombined when the highest-hole Landau level crossed the Fermi level. The recombination continued with increasing field until all the holes vanished, leading to a semimetal-to-semiconductor transition. This transition shifted to a higher field when the electron concentration decreased.

  • Received 7 June 1993

DOI:https://doi.org/10.1103/PhysRevB.48.9118

©1993 American Physical Society

Erratum

Authors & Affiliations

Ikai Lo and W. C. Mitchel

  • WL/MLPO, Wright Laboratory, Wright-Patterson Air Force Base, Ohio 45433-6533

J.-P. Cheng

  • Francis Bitter National Magnet Laboratory, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139

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Issue

Vol. 48, Iss. 12 — 15 September 1993

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