Mode softening in the far-infrared excitation of quantum-wire arrays

Y. Zhao, D. C. Tsui, M. Santos, M. Shayegan, R. A. Ghanbari, D. A. Antoniadis, Henry I. Smith, and K. Kempa
Phys. Rev. B 48, 5249 – Published 15 August 1993
PDFExport Citation

Abstract

We have studied the far-infrared response of GaAs/AlxGa1xAs quantum-wire arrays of 200- and 300-nm periods, realized by biasing a periodic surface-grating gate structure below the two-dimensional electron-gas conduction threshold. We find that in our samples, which have substantially smaller periods than those in previous work, the resonance is observed at a frequency ωr much smaller than that of the depolarization-shifted subband resonance and that the 200-nm-period wires have a smaller ωr than the 300-nm-period wires of the same carrier densities. The experiment demonstrates mode softening in coupled quantum wires. We also present a theoretical model, based on the generalized Kohn theorem, to take into account the mode softening. Our model can quantitatively describe the observed mode softening and explain the experimental results.

  • Received 24 February 1993

DOI:https://doi.org/10.1103/PhysRevB.48.5249

©1993 American Physical Society

Authors & Affiliations

Y. Zhao, D. C. Tsui, M. Santos, and M. Shayegan

  • Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544

R. A. Ghanbari, D. A. Antoniadis, and Henry I. Smith

  • Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139

K. Kempa

  • Department of Physics, Boston College, Chestnut Hill, Massachusetts 02167-3811

References (Subscription Required)

Click to Expand
Issue

Vol. 48, Iss. 8 — 15 August 1993

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×