Abstract
We propose a model to explain recent experimental results concerning the charge trapping in a system of ultrasmall tunnel junctions. Degradation processes in the system are assumed to generate the strange single-electron jumps observed. The model predicts many spectacular features of charge trapping so that it can easily be verified.
- Received 25 November 1992
DOI:https://doi.org/10.1103/PhysRevB.47.9997
©1993 American Physical Society
