Phonon-confinement effect on electron energy loss in one-dimensional quantum wires

V. B. Campos, S. Das Sarma, and M. A. Stroscio
Phys. Rev. B 46, 3849 – Published 15 August 1992
PDFExport Citation

Abstract

We calculate, within the electron-temperature model, hot-electron intrasubband energy relaxation rates via LO-phonon emission in GaAs quantum wires, taking into account quantum degeneracy, dynamical screening, hot-phonon bottleneck, and, in particular, phonon confinement. Two prevailing macroscopic models of phonon confinement, namely, the slab or the electrostatic model and the guided or the mechanical model, are compared quantitatively. We find that the slab model, while giving relaxation rates comparable to the bulk-phonon emission rates, leads to an order of magnitude faster relaxation than the guided model. For reasonable parameter values, the hot-phonon-bottleneck effect is found to be the single most important physical mechanism determining energy relaxation. Numerical values for electronic-energy-loss rates in GaAs quantum wires are provided for both models of phonon confinement for a range of values of the relevant parameters, including confinement size, carrier density, hot-phonon lifetime, and electron temperature.

  • Received 29 April 1992

DOI:https://doi.org/10.1103/PhysRevB.46.3849

©1992 American Physical Society

Authors & Affiliations

V. B. Campos and S. Das Sarma

  • Joint Program for Advanced Electronic Materials, Department of Physics, University of Maryland, College Park, Maryland 20742

M. A. Stroscio

  • U.S. Army Research Office, P.O. Box 12211, Research Triangle Park, North Carolina 27709

References (Subscription Required)

Click to Expand
Issue

Vol. 46, Iss. 7 — 15 August 1992

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×