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Effects of interface-roughness scattering on resonant tunneling

Peter Johansson
Phys. Rev. B 46, 12865(R) – Published 15 November 1992
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Abstract

We calculate the effects of interface-roughness scattering on the current-voltage characteristics of a GaAs-AlxGa1xAs double-barrier structure. We treat this scattering within the coherent-potential approximation so that the theory is nonperturbative and preserves unitarity. The scattering does not change the peak current significantly, even though the electrons are scattered many times while in the quantum well. The valley current, on the other hand, increases by several orders of magnitude in a structure with thick barriers. In good qualitative agreement with recent experiments we find that the peak-to-valley ratio grows only very slowly with barrier thickness for barriers thicker than ≊100 Å.

  • Received 17 August 1992

DOI:https://doi.org/10.1103/PhysRevB.46.12865

©1992 American Physical Society

Authors & Affiliations

Peter Johansson

  • Institute for Studies in Interface Sciences, Facultés Universitaires Notre-Dame de la Paix, 61 rue de Bruxelles, B-5000 Namur, Belgium

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Issue

Vol. 46, Iss. 19 — 15 November 1992

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