Composition modulation and inhomogeneous strain field in InxGa1xAs/InP strained layers

P. Roura, J. Bosch, and J. R. Morante
Phys. Rev. B 46, 10453 – Published 15 October 1992
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Abstract

Optical-absorption measurements have been carried out on tensile and compressive InxGa1xAs/InP strained layers. It is shown that the energetic dispersion of the heavy-hole relative to the light-hole subband σHH/σLH is the key to knowing the origin of the microscopic inhomogeneities. So, σHH/σLH<1 indicates the existence of composition inhomogeneities whereas σHH/σLH=2.8 reveals an inhomogeneous strain field.

  • Received 9 June 1992

DOI:https://doi.org/10.1103/PhysRevB.46.10453

©1992 American Physical Society

Authors & Affiliations

P. Roura, J. Bosch, and J. R. Morante

  • Laboratori de Caracterització de Materials per la Microelectronica, Departament de Física Aplicada i Electrònica, Facultat de Física, Universitat de Barcelona, Diagonal 645, E-08028 Barcelona, Spain

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Issue

Vol. 46, Iss. 16 — 15 October 1992

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