Intrinsic linewidths and radiative lifetimes of free excitons in GaAs quantum wells

Vivek Srinivas, John Hryniewicz, Yung Jui Chen, and Colin E. C. Wood
Phys. Rev. B 46, 10193 – Published 15 October 1992
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Abstract

The giant oscillator strength for radiative transitions of excitons in quantum wells is largely due to the macroscopic polarization of a two-dimensional system. At low temperatures the large oscillator strength leads to a short radiative lifetime of free excitons. We investigate the photoluminescence linewidths and lifetimes of free excitons in a series of extremely high-quality GaAs quantum wells as a function of lattice temperature, excitation intensity, and quantum-well width. With only negligible defect states in our quantum-well sample, we are able to correlate the time-resolved data with temperature-dependent linewidth measurements on the series of quantum wells to estimate the homogeneous linewidth and acoustic-phonon scattering rate of free excitons. Our studies show that thermalization of the excitonic states, ionization into free carriers, and a reduction in the coherence volume of the exciton polarization due to defect scattering, lead to a decrease in the net radiative recombination rate.

  • Received 8 July 1992

DOI:https://doi.org/10.1103/PhysRevB.46.10193

©1992 American Physical Society

Authors & Affiliations

Vivek Srinivas, John Hryniewicz, Yung Jui Chen, and Colin E. C. Wood

  • Joint Program for Advanced Electronic Materials, Department of Electrical Engineering, University of Maryland Baltimore County, Baltimore, Maryland 21228-5398
  • Laboratory for Physical Sciences, College Park, Maryland 20740

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Issue

Vol. 46, Iss. 16 — 15 October 1992

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