Light- and heavy-hole free-exciton transitions in narrow InxGa1xAs/GaAs quantum wells

D. C. Reynolds, K. R. Evans, C. E. Stutz, B. Jogai, C. R. Wie, and P. W. Yu
Phys. Rev. B 45, 11156 – Published 15 May 1992
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Abstract

Photoluminescence measurements were made on narrow InxGa1xAs/GaAs single-quantum-well structures with nominal x values of 0.10 and well widths ranging from 2 to 17 monolayers (ML’s). Transitions due to the collapse of heavy-hole free excitons and light-hole free excitons as well as the usual GaAs band-edge transitions are observed. The measured transition energies are compared with results of band-structure calculations of the light-hole and heavy-hole subband energies for various assumed relative valence-band-offset values. A detailed comparison between the measured and calculated results suggests that the light hole is only marginally, if at all, confined in the 2-, 4-, 6-, and 10-ML wells. Inconclusive results are obtained for the 17-ML well because of an uncertainty in its exact x value. These results directly imply an upper limit of 0.4 for the relative valence-band offset for pseudomorphic In0.10Ga0.90As/GaAs on GaAs(001) heterojunctions. Also reported is a strong dependence of the difference in the calculated light-hole and heavy-hole subband energies on both the indium content and the assumed valence-band offset.

  • Received 5 December 1991

DOI:https://doi.org/10.1103/PhysRevB.45.11156

©1992 American Physical Society

Authors & Affiliations

D. C. Reynolds

  • Southeastern Center for Electrical Engineering Education, St. Cloud, Florida 32769

K. R. Evans and C. E. Stutz

  • Wright Laboratory, Electronic Technology Directorate (WL/EL), Wright-Patterson Air Force Base, Ohio 45433-6543

B. Jogai

  • Universal Energy Systems, Inc., 4401 Dayton-Xenia Road, Dayton, Ohio 45432

C. R. Wie

  • Department of Electrical and Computer Engineering, State University of New York at Buffalo, Amherst, New York 14260

P. W. Yu

  • University Research Center, Wright State University, Dayton, Ohio 45435

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Vol. 45, Iss. 19 — 15 May 1992

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