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Externally generated piezoelectric effect in semiconductor micro- structures

H. Qiang, Fred H. Pollak, C. Mailhiot, G. D. Pettit, and J. M. Woodall
Phys. Rev. B 44, 9126(R) – Published 15 October 1991
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Abstract

We report a study of the effects of large, external uniaxial stress (T) along [001] and [110] on the optical properties of a strained layer (001) In0.21Ga0.79As/GaAs single quantum well. For T∥[110] we have observed a red shift of several peaks and an increase in the intensities of several ‘‘symmetry-forbidden’’ transitions; effects not seen for T∥[100]. This phenomenon is due to an electric field along [001] induced by the piezoelectric coupling for T∥[110].

  • Received 30 May 1991

DOI:https://doi.org/10.1103/PhysRevB.44.9126

©1991 American Physical Society

Authors & Affiliations

H. Qiang and Fred H. Pollak

  • Department of Physics, Brooklyn College of the City University of New York, Brooklyn, New York 11210

C. Mailhiot

  • Lawrence Livermore National Laboratory, Livermore, California 94550

G. D. Pettit and J. M. Woodall

  • IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598

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Vol. 44, Iss. 16 — 15 October 1991

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