Resonant tunneling via microcrystalline-silicon quantum confinement

Qiu-yi Ye, Raphael Tsu, and Edward H. Nicollian
Phys. Rev. B 44, 1806 – Published 15 July 1991
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Abstract

Resonant tunneling involving discrete quantum states in microcrystalline-Si (μc-Si) with a-SiO2 barriers is observed experimentally. The low interface trap densities, and the high barrier height between Si and a-SiO2, allow the observation of several aspects in the physics of quantum confinement. Even for extreme quantum confinement at low gate bias, applied to the Al/a-SiO2/μc-Si/a-SiO2/c-Si structure, the effects of quantized charge accumulation dominate over the wider separation of the energy levels of the quantum box. At high gate bias, we observe a transition from a three dimensionally to a one dimensionally confined system.

  • Received 6 February 1991

DOI:https://doi.org/10.1103/PhysRevB.44.1806

©1991 American Physical Society

Authors & Affiliations

Qiu-yi Ye, Raphael Tsu, and Edward H. Nicollian

  • University of North Carolina at Charlotte, Charlotte, North Carolina 28223

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Issue

Vol. 44, Iss. 4 — 15 July 1991

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