Surface-impedance measurements of superconducting NbN films

D. E. Oates, Alfredo C. Anderson, C. C. Chin, J. S. Derov, G. Dresselhaus, and M. S. Dresselhaus
Phys. Rev. B 43, 7655 – Published 1 April 1991
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Abstract

The temperature and frequency dependences of the surface impedance of NbN thin films have been measured from 4.2 to 13 K and from 0.5 to 10 GHz using a stripline resonator. At 4.2 K resonant-cavity measurements of surface resistance were made at 35 and 56 GHz. From surface-reactance measurements using both cavity and stripline techniques, we obtain the penetration depth extrapolated to 0 K, λ(0)=3700 Å. For the stripline, the film thickness was approximately 8000 Å, which is about two times the measured penetration depth. The weak-coupling (full) Mattis-Bardeen theory was used to fit the temperature dependence of the surface resistance. Based on the quality of the weak-coupling fit to the data, we conclude that the strong-coupling effect is not important in the local and dirty limits. We discuss the correction due to the finite film thickness of the stripline measurements of the surface resistance.

  • Received 7 November 1990

DOI:https://doi.org/10.1103/PhysRevB.43.7655

©1991 American Physical Society

Authors & Affiliations

D. E. Oates and Alfredo C. Anderson

  • Lincoln Laboratory, Massachusetts Institute of Technology, Lexington, Massachusetts 02173

C. C. Chin

  • Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139
  • Rome Air Development Center, U.S. Air Force, Hanscom Air Force Base, Massachusetts 01731

J. S. Derov

  • Rome Air Development Center, U.S. Air Force, Hanscom Air Force Base, Massachusetts 01731

G. Dresselhaus

  • Francis Bitter National Magnet Laboratory, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139

M. S. Dresselhaus

  • Department of Electrical Engineering and Computer Science and Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139

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Issue

Vol. 43, Iss. 10 — 1 April 1991

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