Abstract
The evolution of the electronic properties of the boundary between a solid (Ag) and an overlayer (Cu) as a function of the overlayer thickness is examined to yield the characteristic overlayer thickness for interface formation. The boundary properties are probed by measuring the reflection phase shifts of valence electrons using a quantum-well geometry.
- Received 8 January 1991
DOI:https://doi.org/10.1103/PhysRevB.43.11825
©1991 American Physical Society
