Pressure dependence of photoluminescence in InxGa1xAs/GaAs strained quantum wells

H. Q. Hou, L. J. Wang, R. M. Tang, and J. M. Zhou
Phys. Rev. B 42, 2926 – Published 15 August 1990
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Abstract

Photoluminescence properties of InxGa1xAs/GaAs strained quantum wells with well widths from 13 to 120 Å are investigated as a function of hydrostatic pressure (0–45 kbar) at liquid-nitrogen temperature. Pressure coefficients of the E1hΓ transitions between the quantized ground levels of the Γ conduction band and the heavy-hole valence band are presented. A weak recombination with a pressure coefficient of -2.6 meV/kbar is identified, which is attributable to the transition related to the crossover of the Γ band in the well layer and the X band in the barrier layer. Correlating this transition to barrier-to-well indirect recombination, the valence-band-offset fraction is given as QvEv/(ΔEvEc)=0.32 for a sample with indium fraction of x=0.25. The light-hole band is, therefore, inferred to be type II. Furthermore, the pressure coefficient is found to increase with decreasing well widths, which is opposite to that observed in the GaAs/(Al,Ga)As quantum-well system. A calculation based on the envelope-function model is made to interpret this dependence.

  • Received 23 April 1990

DOI:https://doi.org/10.1103/PhysRevB.42.2926

©1990 American Physical Society

Authors & Affiliations

H. Q. Hou, L. J. Wang, R. M. Tang, and J. M. Zhou

  • Institute of Physics, Chinese Academy of Sciences, Beijing 100 080, People’s Republic of China

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Vol. 42, Iss. 5 — 15 August 1990

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