Abstract
Experimentally observed two-exponential decay of excitonic transitions in GaAs-As multiple quantum wells has been successfully interpreted in terms of the exciton transfer between the continuum (free carriers) and the bound states. The calculation results obtained from this exciton-transfer model are in excellent agreement with experimental observations. The rates of the exciton transfer and the free-carrier recombination have been obtained. We have demonstrated that the emission-energy dependence of the decay time constant of the slower decay component is caused by the variation in exciton binding energy induced by interface roughness in the quantum wells.
- Received 21 May 1990
DOI:https://doi.org/10.1103/PhysRevB.41.12949
©1990 American Physical Society