Molecular-dynamics study of lattice-defect-nucleated melting in silicon

S. R. Phillpot, J. F. Lutsko, D. Wolf, and S. Yip
Phys. Rev. B 40, 2831 – Published 15 August 1989
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Abstract

The high-temperature behavior of both a high-angle twist grain boundary and a free surface on the (110) plane of silicon are investigated using molecular dynamics and the Stillinger-Weber potential. It is found that, above the thermodynamic melting point, melting is nucleated at the grain boundary or surface and propagates through the system with a velocity that increases with temperature. We conclude that, due to the relatively fast nucleation times, melting in real crystals should be initiated at grain boundaries and surfaces, a conclusion that is entirely in accord with experiment.

  • Received 20 January 1989

DOI:https://doi.org/10.1103/PhysRevB.40.2831

©1989 American Physical Society

Authors & Affiliations

S. R. Phillpot, J. F. Lutsko, D. Wolf, and S. Yip

  • Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439

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Issue

Vol. 40, Iss. 5 — 15 August 1989

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