Optical studies in InxGa1xAs/GaAs strained-layer superlattices

F. Iikawa, F. Cerdeira, C. Vazquez-Lopez, P. Motisuke, M. A. Sacilotti, A. P. Roth, and R. A. Masut
Phys. Rev. B 38, 8473 – Published 15 October 1988
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Abstract

We studied the low-temperature photoluminescence, transmission, and the room-temperature Raman scattering spectra of InxGa1xAs/GaAs strained-layer superlattices. The strain in each type of layer was determined from the Raman measurements. From photoluminescence and transmission spectra we determined the energy difference between the confined states of electrons in the conduction band and the strain-split heavy and light holes in the valence band. From these differences we obtain values for the band offset at the InxGa1xAs/GaAs heterojunction.

  • Received 6 June 1988

DOI:https://doi.org/10.1103/PhysRevB.38.8473

©1988 American Physical Society

Authors & Affiliations

F. Iikawa, F. Cerdeira, C. Vazquez-Lopez, and P. Motisuke

  • Instituto de Física, Universidade Estadual de Campinas (UNICAMP), 13 081 Campinas, São Paulo, Brazil

M. A. Sacilotti

  • Centro de Pesquisas e Desenvolvimento (CPqD), Telecommunicaçōes Brasileiras SA (Telebras), 13 100 Campinas, São Paulo, Brazil

A. P. Roth

  • Laboratory for Microstructural Sciences, Division of Physics, National Research Council of Canada, Ottawa, Canada K1A 0R6

R. A. Masut

  • Département de Génie Physique, Ecole Polytechnique de Montréal, Montréal, Québec, Canada H3C 3A7

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Vol. 38, Iss. 12 — 15 October 1988

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