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Antiparallel coupling between Fe layers separated by a Cr interlayer: Dependence of the magnetization on the film thickness

C. Carbone and S. F. Alvarado
Phys. Rev. B 36, 2433(R) – Published 1 August 1987
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Abstract

Spin-polarized low-energy electron diffraction is applied for the first time to study the coupling between ferromagnetic and antiferromagnetic ultrathin films. The remanent magnetization for the epitaxial double-layer structure Feii/Cr/Fei/Cr(100) has been monitored in situ during growth. The two Fe slabs (Feii, Fei) separated by a thin Cr layer show in-plane antiparallel magnetic coupling along the external magnetic field direction when the two Fe-layer thicknesses differ. The measurements suggest a 90° rotation of the antiparallel magnetization for equal Fe-layer thicknesses.

  • Received 7 May 1987

DOI:https://doi.org/10.1103/PhysRevB.36.2433

©1987 American Physical Society

Authors & Affiliations

C. Carbone and S. F. Alvarado*

  • Institut für Festkörperforschung der Kernforschungsanlage Jülich G.m.b.H., D-5170 Jülich, West Germany

  • *Present address: IBM Research Division, Zurich Research Laboratory, 8803 Rüschlikon, Switzerland.

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Issue

Vol. 36, Iss. 4 — 1 August 1987

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