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Infrared linewidths and vibrational lifetimes at surfaces: H on Si(100)

J. C. Tully, Y. J. Chabal, Krishnan Raghavachari, J. M. Bowman, and R. R. Lucchese
Phys. Rev. B 31, 1184(R) – Published 15 January 1985
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Abstract

The temperature dependence of the natural linewidth of an adsorbate-substrate mode, Si-H, has been measured for the first time. Molecular-dynamics simulations of the infrared line shapes, with the use of an accurate ab initio force field and a novel stochastic method to include quantum effects, are in good agreement with experiment. Linewidths are shown to be dominated by pure dephasing above 250 K and by inhomogeneities at low temperature. The vibrational lifetime, computed to be ≃108 s, contributes negligibly to the linewidth.

  • Received 25 October 1984

DOI:https://doi.org/10.1103/PhysRevB.31.1184

©1985 American Physical Society

Authors & Affiliations

J. C. Tully, Y. J. Chabal, Krishnan Raghavachari, J. M. Bowman, and R. R. Lucchese

  • AT&T Bell Laboratories, Murray Hill, New Jersey 07974

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Vol. 31, Iss. 2 — 15 January 1985

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