Silicon self-interstitial migration: Multiple paths and charge states

Y. Bar-Yam and J. D. Joannopoulos
Phys. Rev. B 30, 2216 – Published 15 August 1984
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Abstract

Total energy calculations performed to study the migration of silicon self-interstitials reveal a great complexity of migration paths. Si(++) and Si(0) each migrate along more than one path and different paths from each other. Some paths involve interchange with bulk atoms. Electron-assisted transport occurs for the Si(++) stable tetrahedral site in all directions. Si(0) has several almost-degenerate lowest-energy configurations. The lowest is the "exchange" configuration which also has the possibility of being negative (Si()).

  • Received 24 April 1984

DOI:https://doi.org/10.1103/PhysRevB.30.2216

©1984 American Physical Society

Authors & Affiliations

Y. Bar-Yam and J. D. Joannopoulos

  • Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139

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Issue

Vol. 30, Iss. 4 — 15 August 1984

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