Effect of deep levels on semiconductor carrier concentrations in the case of "strong" compensation

G. F. Neumark
Phys. Rev. B 26, 2250 – Published 15 August 1982
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Abstract

We analyze the carrier concentrations (p) resulting from both shallow and deep majority levels. We show that for comparable concentrations of shallow and of compensating levels, a small fraction of deep levels can decrease p by orders of magnitude. Also, a quantitative criterion for obtaining semi-insulating material is derived, and implications for obtaining conducting wide-band-gap materials are discussed. Another result: a steep ("deep") slope of lnp vs 1T can result even from small percentages of deep levels.

  • Received 22 March 1982

DOI:https://doi.org/10.1103/PhysRevB.26.2250

©1982 American Physical Society

Authors & Affiliations

G. F. Neumark

  • Philips Laboratories, Briarcliff Manor, New York 10510

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Issue

Vol. 26, Iss. 4 — 15 August 1982

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