Laser ablation loading of a surface-electrode ion trap

David R. Leibrandt, Robert J. Clark, Jaroslaw Labaziewicz, Paul Antohi, Waseem Bakr, Kenneth R. Brown, and Isaac L. Chuang
Phys. Rev. A 76, 055403 – Published 8 November 2007

Abstract

We demonstrate loading of Sr+88 ions by laser ablation into a mm-scale surface-electrode ion trap. The laser used for ablation is a pulsed, frequency-tripled Nd:YAG with pulse energies of 110mJ and durations of 4ns. An additional laser is not required to photoionize the ablated material. The efficiency and lifetime of several candidate materials for the laser ablation target are characterized by measuring the trapped ion fluorescence signal for a number of consecutive loads. Additionally, laser ablation is used to load traps with a trap depth (40meV) below where electron impact ionization loading is typically successful (500meV).

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  • Received 22 June 2007

DOI:https://doi.org/10.1103/PhysRevA.76.055403

©2007 American Physical Society

Authors & Affiliations

David R. Leibrandt, Robert J. Clark, Jaroslaw Labaziewicz, Paul Antohi, Waseem Bakr, Kenneth R. Brown, and Isaac L. Chuang

  • Center for Ultracold Atoms, Research Laboratory of Electronics and Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA

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Issue

Vol. 76, Iss. 5 — November 2007

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