Lifetime of the 1s2sS13 metastable level in He-like S14+ measured with an electron beam ion trap

J. R. Crespo López-Urrutia, P. Beiersdorfer, and K. Widmann
Phys. Rev. A 74, 012507 – Published 17 July 2006

Abstract

A precision measurement of the lifetime of the lowest excited level of the He-like S14+ ion carried out at the Livermore EBIT-II electron beam ion trap yielded a value of (703±4)ns. Our method extends the range of lifetime measurements accessible with electron beam ion traps into the nanosecond region and improves the accuracy of currently available data for this level by an order of magnitude.

  • Figure
  • Figure
  • Received 7 April 2006

DOI:https://doi.org/10.1103/PhysRevA.74.012507

©2006 American Physical Society

Authors & Affiliations

J. R. Crespo López-Urrutia*, P. Beiersdorfer, and K. Widmann

  • University of California Lawrence Livermore National Laboratory, Livermore, California 94550, USA

  • *Present address: Max-Planck-Institute for Nuclear Physics, D-69117 Heidelberg, Germany.

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Vol. 74, Iss. 1 — July 2006

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