Optomechanical probes of resonances in amplifying microresonators

Henning Schomerus, Jan Wiersig, and Martina Hentschel
Phys. Rev. A 70, 012703 – Published 8 July 2004

Abstract

We investigate whether the force and torque exerted by light pressure on an irregularly shaped dielectric resonator allow to detect resonant frequencies, delivering information complemental to the scattering cross section by mechanical means. The peak-to-valley ratio in the torque signal can be many times larger than in the scattering cross section, and, furthermore, depends on the structure of the resonance wave pattern. The far-field emission pattern of the associated quasibound states can be tested by the angular dependence of the mechanical mechanical probes at finite amplification rate. We relate the force and torque to the scattering matrix and present numerical results for an annularly shaped dielectric resonator.

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  • Received 1 December 2003

DOI:https://doi.org/10.1103/PhysRevA.70.012703

©2004 American Physical Society

Authors & Affiliations

Henning Schomerus

  • Max-Planck-Institut für Physik komplexer Systeme, Nöthnitzer Str. 38, 01187 Dresden, Germany

Jan Wiersig

  • Institut für Theoretische Physik, Universität Bremen, Postfach 330 440, 28334 Bremen, Germany

Martina Hentschel

  • Department of Physics, Duke University, Box 90305, Durham, North Carolina 27708-0305, USA

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Vol. 70, Iss. 1 — July 2004

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