Observation of dielectronic recombination through two-electron–one-photon correlative stabilization in an electron-beam ion trap

Y. Zou, J. R. Crespo López-Urrutia, and J. Ullrich
Phys. Rev. A 67, 042703 – Published 7 April 2003
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Abstract

Dielectronic recombination (DR) for He-like Ar16+ through both one-electron–one-photon and two-electron–one-photon (TEOP) stabilizations of Li-like states was studied with an electron-beam ion trap (EBIT). It turned out that this is an excellent method to investigate TEOP transitions. Its advantages are a high branching ratio for the TEOP transition and clean conditions under which spectator electrons are controlled. Further, state- and configuration-resolved KLL DR cross sections were obtained due to the unsurpassed electron energy resolution achieved in the EBIT in the energy range around 2 keV.

  • Received 3 October 2002

DOI:https://doi.org/10.1103/PhysRevA.67.042703

©2003 American Physical Society

Authors & Affiliations

Y. Zou*

  • Applied Ion Beam Physics Laboratory, Fudan University, Shanghai 200433, People’s Republic of China

J. R. Crespo López-Urrutia and J. Ullrich

  • Max-Planck-Institut für Kernphysik, Heidelberg, Germany

  • *Electronic address: zouym@fudan.edu.cn

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Vol. 67, Iss. 4 — April 2003

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