Strong-field multiple ionization of krypton

H. Maeda, M. Dammasch, U. Eichmann, W. Sandner, A. Becker, and F. H. M. Faisal
Phys. Rev. A 62, 035402 – Published 17 August 2000
PDFExport Citation

Abstract

We have investigated the multiple ion yields of Kr, up to Kr4+ as a function of the field intensity, that are measured using a linearly polarized short-pulsed Ti:sapphire laser of λ=800nm in the range of up to mid-1015W/cm2, within an S-matrix model for nonsequential multiple ionization. Experimental data and theoretical predictions are in good agreement and the influence of different nonsequential channels on the measured ion yields are analyzed.

  • Received 15 May 2000

DOI:https://doi.org/10.1103/PhysRevA.62.035402

©2000 American Physical Society

Authors & Affiliations

H. Maeda1,*, M. Dammasch1, U. Eichmann1, and W. Sandner1,2

  • 1Max-Born-Institute for Non-Linear Optics and Short Pulse Spectroscopy, 12489 Berlin, Germany
  • 2Technical University Berlin, D-10623 Berlin 12, Germany

A. Becker and F. H. M. Faisal

  • Fakultät für Physik, Universität Bielefeld, D-33501 Bielefeld, Germany

  • *Present address: Department of Physics, University of Virginia, Charlottesville, VA 22903.
  • Present address: Centre d’Optique, Photonique et Laser, Département de Physique, Université Laval, Québec, Canada G1K 7P4.

References (Subscription Required)

Click to Expand
Issue

Vol. 62, Iss. 3 — September 2000

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review A

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×