Electron-impact excitation cross sections of neon

J. Ethan Chilton, M. D. Stewart, Jr., and Chun C. Lin
Phys. Rev. A 61, 052708 – Published 7 April 2000
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Abstract

To determine the direct electron-impact excitation cross sections with the optical method, one must measure all transitions out of a level, as well as the cascade into the level of interest from higher-lying energy levels. Considered here are the ten levels of the 2p53p configuration of neon, whose emissions to lower levels fall within a range of 540–810 nm. This allows an investigation via a monochromator-photomultiplier tube system. Cascades into these levels from 2p54s and 2p53d, however, emit radiation in the 740–1720-nm range, part of which is outside the limit of photomultiplier detection. We employ a Fourier-transform spectrometer to examine the near-infrared lines. We report direct electron excitation cross sections for the ten 2p53p levels for electron energies up to 200 eV. In addition, we provide apparent excitation functions for the 2p54s and 2p53d levels. We have also observed a dependence of the optical emission cross sections on pressure, and describe this effect within the framework of the resonance radiation reabsorption model.

  • Received 19 November 1999

DOI:https://doi.org/10.1103/PhysRevA.61.052708

©2000 American Physical Society

Authors & Affiliations

J. Ethan Chilton, M. D. Stewart, Jr., and Chun C. Lin

  • Department of Physics, University of Wisconsin, Madison, Wisconsin 53706

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Vol. 61, Iss. 5 — May 2000

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